JU, Chengru; TRINH, Toan Khang. A Machine Learning Approach to Supply Chain Vulnerability Early Warning System: Evidence from U.S. Semiconductor Industry. Journal of Advanced Computing & Intelligent Systems, [S. l.], v. 3, n. 11, p. 21–35, 2023. DOI: 10.69987/. Disponível em: https://learnedvertex.com/index.php/JACIS/article/view/77. Acesso em: 6 oct. 2026.